2003 Quality & Productivity Research Conference IBM T. J. Watson Research Ctr., Yorktown Heights, NY May 21-23, 2003

Invited Paper Sessions

Opening Plenary Session

Session Organizer: Emmanuel Yashchin, IBM Research

Session Chair: Emmanuel Yashchin, IBM Research
1. Conference kick-off: Paul Horn, IBM Senior VP, Research.

2. "Quality Mangement and Role of Statistics in IBM", Mike Jesrani, Director of the IBM Quality Management Process.

3. TBD, Anil Menon, IBM VP, Corporate Brand Strategy and Worldwide Market Intelligence.

1. Experimental Design

Session Organizer: Tim Robinson, University of Wyoming, Doug Montgomery,

Session Chair: Tim Robinson, University of Wyoming

1. "Graphical Methods to Assess the Prediction Capability of Mixture and Mixture-Process Designs", Heidi Goldfarb, Dial Corporation, Connie Borror, Arizona State University, Douglas Montgomery, Arizona State University, Christine Anderson-Cook, Virginia Polytechnic Institute and State University.

2. "Fraction of Design Space Graphs for Assessing Robustness of GLM Designs", Christine Anderson-Cook, Virginia Polytechnic Institute and State University.

3. "Using a Genetic Algorithm to Generate Small Exact Response Surface Designs", John Borkowski, Montana State University.

2. Use of Bayesian Methods for Metrology in NIST

Session Organizer: William Guthrie, NIST
Session Chair: William Guthrie, NIST
1. "Bayesian Estimate of the Uncertainty of a Measurand Recorded with Finite Resolution", Blaza Toman, Statistical Engineering Division, NIST

2. "MCMC in StRD", Hung-kung Liu, Will Guthrie, and Grace Yang
Statistical Engineering Division, NIST

3. "Parameter Design for Measurement Protocols by Latent Variable Methods", Walter Liggett, Statistical Engineering Division, NIST

3. Statistical Modeling

Session Organizer: Emmanuel Yashchin, IBM Research
Session Chair: Emmanuel Yashchin, IBM Research
1. "Bayesian Modeling of Dynamic Software Reliability Growth Curve Models", Bonnie Ray, IBM Research
2. "Wafer Yield Modeling", Asya Takken, IBM Microelectronics, Mary Wisniewski and Emmanuel Yashchin, IBM Research
3. "Multivariate system monitoring using nonlinear structural equation analysis", Yasuo Amemiya, IBM Research

4. Advances in Statistical Process Control 1

Session Organizer: Zachary Stoumbos, Rutgers University
Session Chair: Zachary Stoumbos, Rutgers University
1. ãThe Effects of Process Variation on Multivariate Control Proceduresä, Robert L.Mason, Southwest Research Institute, Texas, You-Min Chou, The University of Texas at San Antonio, and John C. Young, McNeese State University, Lake Charles, LA

2. ãComparison of Individual Multivariate Control Charts - A Hybrid Approach for Process Monitoring and Diagnosis", Wei Jiang, INSIGHT, AT&T Labs and Kwok-Leung Tsui, Georgia Institute of Technology, Atlanta, GA
3. ãThe Mean Changepoint Formulation for SPCä, Douglas M. Hawkins, University of Minnesota, Minneapolis, MN, and Peihua Qiu, University of Minnesota, Minneapolis, MN

5. Statistical Methods for Software Engineering

Session Organizer: Bonnie Ray, IBM Research Division
Session Chair: Bonnie Ray, IBM Research Division

1. ãSome Successful Approaches to Software Reliability Modeling in Industryä, Daniel R. Jeske and Xuemei Zhang, Bell Laboratories, Lucent Technologies

2. "Analyzing the Impact of the Development Activity Allocation on Software Team Productivity", I. Robert Chiang and Lynn Kuo, University of Connecticut

3. "Hierarchical models for software testing and reliability modeling", Todd Graves, Los Alamos National Laboratory

6. Statistics in Setting Standard, Dealing with Shocks, and Text Mining

Session Organizer: Regina Liu, Rutgers University
Session Chair: Regina Liu, Rutgers University
1. "Key Comparisons for International Standards", David Banks, U.S. Food and Drug Administration
2. "Shock Models", Juerg Huesler, University of Bern, Switzerland
3. "Text Mining of Massive Report Data and Risk Management", Dan Jeske, Lucent Technology & Regina Liu, Rutgers University

7. Operating window experiments and extensions

Session Organizer: C. Jeff Wu, University of Michigan
Session Chair: John A. Cornell, University of Florida

1. "Operating Window - An Engineering Measure for Robustness",

Don Clausing, MIT.

2. "Failure amplication method (FAMe): an extension of the operating window method", Roshan Joseph, Georgia Tech.

3. Discussants: W. Notz, Ohio State University, Dan Frey, MIT

8. Examples of Adapting Academic Reliability Theory to Messy Industrial Problems
Session Organizer: Michael Tortorella, Rutgers University
Session Chair: Michael Tortorella
1. "Product or Process?", David A. Hoeflin (AT&T Labs)

2. "Practical experiment design for protecting against masked failure mechanisms in accelerated testing", Michael LuValle (OFS Laboratories)

3. "System Reliability Redundancy Allocation with Risk-Averse Decision Makers", David W. Coit (Rutgers)

9. Statistics in the Semiconductor Industry

Session Organizer: Asya Takken, IBM Microelectronics Division
Session Chair: Asya Takken, IBM Microelectronics Division
1. "Case Studies of Batch Processing Experiments", Diane Michelson, Sematech

2. "Using Supersaturated Experiment Designs for Factor Screening and Robustness Analysis in the Design of a Semiconductor Clock Distribution Circuit", Duangporn Jearkpaporn, Arizona State University, Steven A. Eastman, Intel Corporation, Gerardo Gonzalez-Altamirano, Intel Corporation, Don R. Holcomb, Honeywell Engines and Systems, Alejandro Heredia-Langner, Pacific Northwest National Laboratory, Connie M. Borror, Arizona State University, Douglas C. Montgomery, Arizona State University

3. "Spatial Mixture Models and Detecting Clusters with Application to IC Fabrication", Vijay Nair and Lian Xu, University of Michigan / Bristol-Myers and Squibbs.

10. Advances in Statistical Process Control 2

Session Organizer: Zachary Stoumbos, Rutgers University
Session Chair: Zachary Stoumbos, Rutgers University
1. ãA General Approach to the Monitoring of Process and Product Profiles, William Woodall, Virginia Polytechnic Institute and State University, Blacksburg, VA, and Douglas M. Montgomery, Arizona State University, Tempe, AZ

2. "An Approach to Detection of Changes in Attribute Data", Emmanuel Yashchin, IBM Research

3. TBD

11. Industrial Applications of Six Sigma at GE

Session Organizer: Christopher Stanard, GE Global Research
Session Chair: Christopher Stanard, GE Global Research
1. "Designing Six Sigma Assemblies", Narendra Soman, GE Global Research
2. "Incremental performance improvement during development of diagnostic algorithms", Kai Gobel, GE Global Research
3. "Development of Laser Welding of Electrodes for Ceramic Metal Halide Arc Tubes", Marshall Jones, GE Global Research

12. Industrial Statistics at Bell Labs Today

Session Organizer: Diane Lambert, Bell Labs
Session Chair: Diane Lambert, Bell Labs

1. "Statistical Technology Transfer through Software Components", David James, Duncan Temple Lang and Scott Vander Wiel, Bell-Labs, Lucent Technologies

2. "Setting Specifications and Adjustment Rules in Multistage Production", Suresh Goyal and Scott Vander Wiel, Bell-Labs, Lucent Technologies

3. "Reliability Estimation From Accelerated Degradation and Failure Data", Diane Lambert, Chuanhai Liu, and Scott Vander Wiel, Bell-Labs, Lucent Technologies

13. Bayesian Reliability

Session Organizer: Ramon Leon, University of Tennessee
Session Chair: Ramon Leon, University of Tennessee
1. "Bayesian System Reliability", Michael Pore and Paul Tobias (Sematech, Ret.)

2. "Physical Science Case Studies in Bayesian Analysis Using WinBUGS",William Guthrie, Statistical Engineering Division, NIST

3. "Bayesian Modeling of Accelerated Life Tests with Heterogeneous Test Units", Avery J. Ashby, Ramon V. Leon, Jayanth Thyagarajan, University of Tennessee, Knoxville

14. Invited Tutorial Session: Algorithms for Efficient Statistical Data Mining

Session Organizer: Susan Albin, Rutgers University
Session Chair: Susan Albin, Rutgers University
Speaker: Andrew Moore, Carnegie Mellon University

15. Sequential Methods

Session Organizer: Michael Baron, University of Texas, Dallas and IBM Research
Session Chair: Michael Baron
1. "On sequential determination of the number of computer simulations", Nitis Mukhopadhyay, University of Connecticut

2. "Balanced Randomization Designs and Classical Probability Distributions", Andrew L. Rukhin, University of Maryland
3. "Asymptotic Analysis of Bayesian Quickest Change Detection Procedures", Venugopal V. Veeravalli, University of Illinois at Urbana-Champaign, Alexander Tartakovsky, University of Southern California and Michael Baron, University of Texas, Dallas and IBM Research

16. Institute for Operations Research and the Management Sciences (INFORMS) Invited Session

Session Organizer: Susan Albin, Rutgers University
Session Chair: Susan Albin, Rutgers University
1. "Optimal Adjustment Of A Process Subject To Unknown Setup Errors Under Quadratic Off-Target And Fixed Adjustment Costs", Zilong Lian and Enrique Del Castillo, The Pennsylvania State University
2. "Process-oriented Tolerancing for Quality Improvement in Multi-station Assembly Systems", Dariusz Ceglarek, Wenzhen Huang, University of Wisconsin - Madison
3. "Robust Optimization of Experimentally Derived Objective Functions", Susan Albin, Rutgers University and Di Xu, American Express

17. Statistics in the Corporate Finance

Session Organizer: Radu Neagu, GE Research
Session Chair: Radu Neagu, GE Research
1. "Application of Six Sigma to Corporate Finance", Roger Hoerl, GE Global Research", Roger Hoerl, GE Global Research

2. "Fair Valuation of Employee Stock Options", Antonio Possolo and Brock Osborn, GE Global Research

3. "From Corporate Default Prediction to Market Efficiency: a case study orporate default prediction and market efficiency", Radu Neagu and Roger Hoerl, GE Global Research.