Conference Program

TENTATIVE AGENDA

Click here for a list of the invited speaker abstracts, organized by session number.
Click here for a list of contributed speaker abstracts, organized by
session number.

Tuesday, June 3
9:30 AM - 5:00 PM Pre-Conference Short Course: Graphical Analysis of Designed Experiments, Dr.Veronica Czitrom
Wednesday, June 4
7:30 AM - 8:30 AM Continental Breakfast
8:30 AM - 10:00 AM Opening Invited Plenary Session 1– Presentation of the Lifetime Achievement Award to George Box, University of Wisconsin-Madison followed by his address: Synergistic Control
10:00 AM - 10:30 AM Break
10:30 AM - 12:15 PM

Invited Plenary Session 2 – Joint Work with George Box,
George Box and the Development of Statistics Program at Wisconsin, George Tiao, University of Chicago
Early exciting days with George Box, John S (Stu) Hunter, Princeton University
12:15 PM - 1:30 PM Lunch
1:30 PM - 3:00 PM Concurrent Sessions
(ICS1) George Box’s Contributions to Q & P – Soren Bisgaard

(ICS2) Robust Parameter Design After 25 Years – Jeff Wu, Georgia Tech
Simulation on Demand - Bruce Ankenman, Northwestern University.
Robust Design, Modeling and Analysis of Measurement Systems - Tirthankar Dasgupta, Harvard University
Bayesian Optimal Single Arrays for Robust Parameter Design - V. Roshan Joseph, Georgia Institute of Technology

(ICS3) Six Sigma in China, Bill Parr, China Europe International Business School
3:00 PM - 3:15 PM Break
3:15 PM - 4:45 PM Presentation of the 2008 Conference Honoree Award to Jeff Wu, Georgia Tech. The Honoree’s Address: Quality Technology in the High-Tech Age – Jeff Wu
5:30 PM - 6:30 PM Reception
6:30 PM - 9:00 PM Conference Banquet and Scholarship Awards Presentations
Thursday, June 5
7:30 AM - 8:30 AM Continental Breakfast
8:30 AM - 10:00 AM

Concurrent Sessions
(ICS4) Design and Analysis of Computer Experiments – Doug Montgomery
Design and Analysis of Computer Experiments – Bradley
Jones, JMP
Comparing Designs for Computer Simulation Models – Rachel T. Johnson, Arizona State University
Discussant: Geoff Vining, Virginia Tech

(ICS5) Reliability – William Q. Meeker, Iowa State University
An Algorithm for Computing Approximate Variances and Covariances of Model Parameters from a Repeated Measures Degradation Model with Applications – Brian Weaver, Iowa
State University
Materials Degradation Experiments – Joanne Wendelberger, Los Alamos National Laboratory
Reliability Analysis of Accelerated Degradation Data – David C. Trindade, SUN Microsystems

(ICS6) Extreme Risk Inference and Management - Regina Liu, Rutgers University
Pitting Corrosion: Analysis of Designed Experiments with Extreme Value Distributed Responses - Holger Rootzen, Chalmers University of Technology, Sweden
Thresholding Events of Extreme in Simultaneous Monitoring of Multiple Aviation Risk Indicators - Jun Li, University of
California, Riverside
Estimating Extreme Quantile Regions for Two Dependent Risks - John H.J. Einmahl, Tilburg University, The Netherlands

(CCS1) Contributed Session - Statistical Process Control
Profile Monitoring Analysis Using Semiparametric Methods – Abdel-Salam Abel-Salam, Virginia Polytechnic & State University
Visual Teaching Aid for Control Charts and Capability Measures – Jim Alloway
Model-Based Multivariate Monitoring Charts for Autocorreclated Processes – Xuan Huang, University of Massachusetts – Amherst
Improving the Applications of Sequential Sampling Methods to Entomological Problems and Other Areas, Payal Shah – University of California – Riverside
A Kolmogorov-smirnov Type Statistic to Test the Randomness Control Chart Data – John Stedl, Chicago State University
10:00 AM - 10:30 AM Break
10:30 AM - 12:15 PM (ICS7) DOE Software Trends – Brad Jones, SAS
What Commercial DOE Software Should Do – Chris Nachtsheim, University of Minnesota - Minneapolis
Computing, Theory, and Finding Good Designs – John P. Morgan, Virginia Tech
Algorithms to Search for Optimal Designs – William Li, University of Minnesota - Minneapolis

(ICS8) Environmental Aspects of Reliability – Reinaldo Gonzales, General Electric Co.
Synergizing Reliability Engineering Tools – Bill Denson,
Corning Inc.
Implications of Environmental Requirements (Pb-free) on the Reliability and Testing of Flip-Chip Solder Joints in Packaged IC Chips – Timothy Sullivan, IBM Microelectronics
Accelerated Testing: The Catalyst Converging Physics And Reliability Statistics – Larry Edson, Hobbs Engineering Corp
Chip-Scale Package Reliability Study for Medical Electronics, James E. Simpson, GE Global Research

(ICS9) New Methods for Network and Recurrent Event Analysis – Ta-Hsin Li, IBM Research
Optimal Designs for Network Traffic Measurement Schemes – George Michailidis, University of Michigan
Analysis of Window-Observation Recurrence Data – Huaiqing Wu, Iowa State University
Maximum Likelihood Estimators of Clock Offset and Skew under Exponential Delays – Jun Li and Daniel R. Jeske, University of California at Riverside

(CCS2) Contributed Session - System Analysis and Data Mining Methods
A Probabilistic Approach to Representing and Analyzing Uncertainty in Large-Scale Complex System Models – Douglas Allaire, Massachusetts Institute of Technology
Partitioned Partial least Squares – Stina Andersen, Arizona State University
The Efficiency of Logistic Regression Compared to Normal Discriminant Analysis Under Class-Conditional Classification Noise – Yingtao Bi, University of California – Riverside
Validation of A High Throughput Microarray System – Shu-Pang Huang, Bristol-Meyers Squibb
A Three-Clas Neutral Zone Classifier Using A Decision-Theoretic Approach with Applications – Hua Yu University of California - Riverside
12:15 PM - 1:30 PM Lunch
12:00 PM - 2:00 PM Q&P Section Executive Committee meeting – Connie Borror
1:30 PM - 3:00 PM Concurrent Sessions
(ICS10) Teaching and Training of Statistics – Stefan Steiner
Translating Understanding of a Complex System into a Statistical Model – Christine M. Anderson-Cook, Los Alamos National Laboratory

A Simple Experimental Scenario for Teaching DOE – Scott Kowalski, Minitab Inc.
Teaching Applied Statistics Using a Virtual Manufacturing Process – Stefan Steiner, University of Waterloo


(ICS11) Experimental Design Techniques for Optimization – Will Guthrie
Analysis of Optimization Experiments - James Delaney, Carnegie Mellon University
Adaptive One Factor at a Time Experiments: Extensions of Theory and Practice - Dan Frey, Massachusetts Institute of Technology
Experimental Design in the Scheduling of Two Unrelated Parallel Processors – Dennis Leber, National Institute of Standards & Technology

(ICS12) The Books of Madison, Wisconsin - Jim Alloway
Statistics for Experimenters - . Stuart Hunter, coauthor
Fourth Generation Management - Brian L. Joiner, author
The Team Handbook and The Leader’s Handbook - Peter R. Scholtes, author

(CCS3) Contributed Session - Design of Experiments 1
Use of Mahalanobis Distance and Taguchi Methods to Improve Client Experience – Rajesh Jugulum, Bank of America
Screening Designs with Reasonably-Balanced Projections – Timothy Kramer, Lilly Research Laboratories
Response Plots for Experimental Design – David Olive, Southern Illinois University
Nested Latin Hypercube Designs – Peter Qian, UW-Madison
Semifolding General Two-Level Factorial Designs – Po Yang, DePaul University
3:00 PM - 3:15 PM Break
3:15 PM - 4:45 PM Concurrent Sessions
(ICS13) Statistical Methods in Reliability – Martha Gardner, General Electric Co.
Analysis of Accelerated Life Tests with Random Effects – Ramon Leon, University of Tennessee - Knoxville
Risk, Reliability, and Repair – Brock Osborn, General Electric Co.
Monitoring Reliability Data – Emmanuel Yashchin, IBM Research Division

(ICS14) Design, Analysis and Utilization of Complex Computer Models - Peter Qian, University of Wisconsin-Madison
Calibrating a Computer Code in the Presence of Systematic Discrepancy - Brian Williams, Los Alamos National Laboratory
A Level-Set-Based Multistage Metamodeling Approach for Design Optimization - Wei Chen, Northwestern University
Evaluating and Improving the Usefulness of Computational Models - Genetha Anne Gray, Sandia National Laboratories

(ICS15) Special INFORMS Invited Session: Fault Monitoring and Diagnosis for Complex Systems – Shiyu Zhou, University of Wisconsin-Madison
Diagnosis of Process and Sensor Faults in Manufacturing Processes - Shan Li and Yong Chen, University of Iowa
Multiple Fault Signature Integration and Enhancing for Variation Source Identification in Manufacturing Processes - Li Zeng, Nong Jin, and Shiyu Zhou, University of Wisconsin-Madison
Classification Methods for Highly Imbalanced Class Sizes in Warranty Data - Eunshin Byon, Abhishek K. Shrivastava, and Yu Ding, Texas A&M University
Multiscale Wavelet Analysis for Multiple Embedded Operations Monitoring Using Aggregated signals - Jionghua (Judy) Jin, Jing Li, and Yong Lei, University of Michigan

(CCS4) Contributed Session - Design of Experiments 2
A review of Dorian Shainin's variable search – Nagesh Adiga, Georgia Institute of Technology
Parioritization of the Balancing Property and Full Estimability in Mixed-Level Designs – Stefano Barone, University of Palermo
Creative Analysis Methods Applied to a Fractional Factorial Design to Resolve Inconsistent Results – Janis Dugle, Abbott Nutrition
Bayesian Optimal Blocking of Two-Level Designs – Lulu Kang, Georgia Institute of Technology
Applications of DOE During Verification Stage – Shari Kraber, Stat-Ease, Inc.
5:30 PM - 8:30 PM Reception and Entertainment
Friday, June 6
7:30 AM - 8:30 AM Continental Breakfast
8:30 AM - 10:00 AM

Concurrent Sessions
(ICS16) Reliability Assurance for Mission-Critical Systems – Narendra Soman, General Electric Co.
Reflections on Storage Systems Reliability – KK Rao, IBM Almaden Research Center
Application of Reliability Methods in Validation of Medical Devices – David Burns, Boston Scientific
Reliability Testing for Life Support Systems – Todd Heydt, GE Healthcare

(ICS17) George Box’s Contributions to Q&P – Geoff Vining, Virginia Tech
George's Contributions to Quality - Bovas Abraham, University
of Waterloo
George's Contributions to Process Control - John MacGregor, McMaster University, Canada
George's Contributions to Industrial Experimentation - Geoff Vining, Virginia Tech

(ICS18) Industrial Split-lot Experimentation – Di Michelson, Sematech
Designing and Running Super-Efficient Experiments: Optimum Blocking for Fractional Factorials or for More than One Hard-to-Change Factor – James M. Lucas, J.M. Lucas & Associates
Fractional Factorial Designs for Multi-Step Processes – Jose Ramirez, W.L. Gore & Associates, Inc.
A new type of design for experiments with more than one hard-to-change factor – Heidi Arnouts, Universiteit Antwerpen

(CCS5) Contributed Session - Evaluation of System Properties
Six Sigma Implementation in the UK Manufacturing SMEs: A Multiple Case-Study Analysis and Key Findings – Jiju Antony, University of Strathclyde
A Statistical Approach to Quanitfying the Elastic Deformation of Nanomaterials – Xinwei Deng, Georgia Institute of Technology
Effects of Warpage on Fatigue Reliability of Solder Bumps: Experimental and Analytical Studies – Ying Hung, Georgia Institute of Technology
Mis-specification Analysis of Linear Degradation Models – Chien-Yu Peng, National Tsing-Hua University
Local-Functional ANOVA for Process Models, Mixture Models, and Deterministic Systems – Joseph Voelkel, RIT
10:00 AM - 10:30 AM Break
10:30 AM - 12:00 PM Concurrent Sessions
(ICS19) Applications in Reliability – Nalini Ravishanker, University of Connecticut
Inference for the Step-Stress Model with Lagged Effects – Nandini Kannan, University of Texas at San Antonio
Bayesian Sample Size Determination for Reliability Studies of a Binary Trait – Cyr E. M’Lan, University of Connecticut
Methodologies for Recurrent Event Data under Competing Risks – Ananda Sen, University of Michigan

(ICS20) Statistical Process Control – Dan Jeske, University of California – Riverside
Using Statistical Process Control for Change Detection in Network Systems - Mazda Marvasti, Integrien Corporation
Statistical Process Control for Non-stationary Processes: An Example Based Tour - Bart De Ketelaere, Bert Ostyn, Kristof Mertens, Josse De Baerdemaeker and Paul Darius, Division of Mechatronics, Biostatistics and Sensors (MeBioS)
Using the Repeated Two-Sample Rank Procedure for Detecting Anomalies in Space and Time - Ron Fricker, Naval
Postgraduate School
A Nonparametric Cusum Algorithm for Timeslot Sequences with Applications to Network Surveillance - Veronica Montes de Oca and Daniel R. Jeske, University of California - Riverside

(ICS21) Response Surface Models with Random Effects – Andre Khuri, University of Florida
A Discussion of Various Ways to Analyze Data From Response Surface Split-Plot Experiments – Peter Goos, University of Antwerp, Belgium
Robust Parameter Design Using Generalized Linear Mixed Models – Shaun Wulff, The University of Wyoming
Designs for Response Surface Models with Random Block Effects – Sourish Saha, GlaxoSmithKline

(ICS22) Demand Management in Large-Scale Computing, Bill Heavlin, Google, Inc.
User Preference and Search Engine Latency, Jake Brutlag,
Google, Inc.
Statistical Approach to Optimal Consolidation of Computer Workload, Ta-Hsin Li, IBM TJ Watson Research Center
Forecasting Telecommunications Traffic and Internet Activity, Gordon Reikard, Sprint-Nextel
12:30 PM - 3:00 PM Post-Conference Meeting of QPRC Steering Committee and Planning Committee


 

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