Joint Research Conference
June 24-26, 2014
Modern complex systems often present the analyst with a mix of data types that can be used for reliability prediction: system test results, lifetime data from unit tests of components, and subsystems data, all of which may have predictive value for the system lifetime. We present a hierarchical Bayesian nonparametric framework, in which time-to-event distributions may be estimated from test data and/or derived based on physical failure mechanisms.