Joint Research Conference

June 24-26, 2014

Quality and Reliability Analysis in the Era of Big Data

Abstract:

I discuss the changing requirements of quality control and reliability analysis in the face of the large volumes of heterogeneous data that can now be collected for modeling and monitoring physical and environmental systems.  Examples include methods to identify issues in IBM’s semiconductor manufacturing processes, as well as techniques developed for monitoring thousands of IT system-level metrics to detect anomalies or assessing the condition of utility or energy systems.  I’ll then talk about how these rich sets of data can be also used to move from modeling and monitoring of system reliability to learning and adapting to changing environments.