2007 Quality and Productivity Research Conference


	Conference Program The technical program for the conference runs from the morning of Monday, June 4th until noon on Wednesday, June 6th. The short course "Beyond the Factory Floor: Succeeding With Six Sigma Outside Manufacturing" by Roger Hoerl will begin at 1 p.m. on Wednesday, June 6th. Monday, June 4, 2007 7:30 - 9:00 a.m. Registration 8:00 - 8:45 a.m. Morning Refreshments 8:45 - 9:00 a.m. Welcome 9:00 - 10:00 a.m. Plenary Session, Ronald Iman Statistical Aspects of Forecasting and Planning for Hurricanes 10:00 - 10:30 a.m. Break 10:30 - 12:00 noon Sessions Invited: Design and Analysis of Industrial Experiments Chair: Rob McLeod, University of Winnipeg Axial Distance Choices in a Split-Plot CCD, Scott Kowalski On Frequentist and Bayesian Approaches to Inference in Industrial Split-plot Screening Experiments, John Brewster A Bayesian Framework for Planning Reliability Experiments, Michael Hamada Invited: Issues and Applications involving SPC, Lean, and Six Sigma Chair: Aparna Huzurbazar, University of New Mexico Linking Statistical Thinking to Six Sigma, Lynne Hare Effects of Process Variation on the Use of Lean Principles in the US Air Force's Maintenance and Overhaul Facilities, Elvira Loredo Using Control Charts to Detect Anomalous Morphological Measurements in Brain Imaging, Sumner Williams Contributed: Nonlinear and Simulation-Based Methods Chair: William Woodall, Virginia Tech Improvements on Nonlinear Regression Models for Cycle Time - Throughput Curves, Rachel Johnson Statistical Robustness Study for Kinetic Models, J.P. Engelbrecht Statistical Process Monitoring of Nonlinear Profiles Using Wavelets, Eric Chicken 12:00 - 1:30 p.m. Lunch 1:30 - 3:00 p.m. Sessions Invited: Recent Advances in Response Surface Methods Chair: Timothy Robinson, University of Wyoming A Graphical Approach for Assessing Optimal Operating Conditions in Robust Design, Anu Abraham A New Approach to the Design of Experiments for Robust Parameter Design, William Myers Assessing Uncertainty of Regression Estimates in a Response Surface Model for Repeated Measures, Shaun Wulff Invited: Statistical Issues in Communication Networks Organizers: Vijay Nair, University of Michigan and Earl Lawrence, Los Alamos National Laboratory Chair: Kary Myers, Los Alamos National Laboratory Estimation of Traffic Flow Characteristics from Sampled Data, Lili Yang An Aspect of Topology Determination Fei Chen Toward a Complete Active Tomography Framework, Earl Lawrence Contributed: Analytical Measurement Systems with Case Studies at Eli Lilly-ELANCO Chair: Joanne Wendelberger, Los Alamos National Laboratory Analytical Method Improvement Yields Dramatic Reduction in Variation for Both Analytical and Final Formulation Processes, Roger Norris A Designed Experiment Examining HPLC Configurations and Injection Volumes Yields both Expected and Unexpected Results, Bill Sarell A DOE Examining HPLC Cap-Vial Combination Yields Unexpected and Significant Results, LeRoy Franklin 3:00 - 3:30 p.m. Break 3:30 - 5:00 p.m. Sessions Panel: Working Effectively With Non-Statisticians Chair: Scott Kowalski, Minitab Inc. Working Effectively With Non-Statisticians, Roger Hoerl, Angela Patterson, and Ron Snee Contributed: Industrial Applications Chair: Kristi Griffiths, Eli Lilly & Co. Exploring the Statistical Relationship Between Culture, Strategies and Manufacturing Processes in Japanese Automotive Parts Production Facilities in North America, Scott Dickenson Productivity Gains Through Extended Run Qualification, Cara Estes A TrendCycle Forecasting Model of Automotive Sales, Expected Registrations or Industry Registrations, James Wendelberger 5:00 - 6:00 p.m. Award Talk, Teaching Designing Experiments: Some Adventures and Lessons Learned, Douglas Montgomery 6:30 - Banquet - After Dinner Speaker: "P.O. Box 1663, The Beginning of Los Alamos" Ellen Bradbury Reid (biography) Tuesday, June 5, 2007 7:45 - 8:30 a.m. Morning Refreshments 8:30 - 10:00 a.m. Sessions Invited: Countering Common Misperceptions and Misunderstandings in Statistical Analysis Organizer: Will Guthrie, National Institute of Standards and Technology Chair: Lynne Hare, Kraft Foods Misconceptions about Statistics in an Industrial Setting, William Brenneman Basic Points of Confusion with Inference, Mark Bailey Countering Misconceptions Associated with Correlation in Uncertainty Assessment, Will Guthrie Invited: Measurement Systems Analysis: Methods and Applications Chair: Connie Borror, Arizona State University West Characteristics of Technical Variation in Expression Microarray Assays, Walter Liggett Assessing Binary Measurement Systems, Stefan Steiner Assessing the Effect of Measurement Error on Process Yield, Greg Larsen Contributed: Further Topics in Design of Experiments Chair: David Drain, University of Missouri-Rolla Experiments with Changes in the Design Region, Joanne Wendelberger Optimal Block Sequences for Blocked Fractional Factorial Split-Plot Designs, Robert McLeod Design and Analysis of Experiments Applied to Critical Infrastructure Simulation, Leslie Moore 10:00 - 10:30 a.m. Break 10:30 - 12:00 noon Sessions Invited: Advances in Warranty Data Analysis Organizer: Emmanuel Yashchin, IBM Chair: Wayne Nelson, Wayne Nelson Statistical Consulting Some Challenges in Warranty Data Analysis and Its Use, Jeff Robinson Analysis of Window-Observation Recurrence Data, Bill Meeker Warranty Analysis of Repairable Systems, David Trindade ISBIS Special Session: A Conversation about the Proper Choice of Experimental Design Organizer: Geoff Vining, Virginia Tech Chair: Stefan Steiner, University of Waterloo A Mixture Design Planning Process, Pat Whitcomb The Beauty of Classical Designs, Geoff Vining Practitioner’s View of Optimality, Julia O’Neill Contributed: Tools in Quality and Productivity Chair: William Brenneman, Proctor and Gamble Company Using Statistical Thinking to Optimize Scientific Studies, Kristi Griffiths A Quality Assessment Tool to Support Improvement Planning, Sam Woolford Data Mining, in Theory and In Practice, Valerie Peters Hands On Learning Aids for Teaching DOE Concepts, Jim Alloway 12:00 - 1:30 p.m. Lunch 1:30 - 3:00 p.m. Sessions Panel: Boosting Our Research Productivity: Models for Successful Industry / Academic / Government Collaboration Organizer and Chair: Angela Patterson, General Electric Global Research Boosting Our Research Productivity: Models for Successful Industry / Academic / Government Collaboration, Matthew Rotelli, Alan Karr, and Tom Lange Invited: Statistical Advances in High Technology Organizers: Jeff Wu and Roshan Vengazhiyil, Georgia Institute of Technology Chair: Leroy Franklin, Eli Lilly Gaussian Process Models for Computer Experiments With Qualitative and Quantitative Factors, Zhiguang (Peter) Qian Statistical Modeling and Analysis for Robust Synthesis of Nanostructures, Tirthankar Dasgupta Design and Analysis of Experiments Using Nested Factors With Applications to Machining, Ying Hung 3:00 - 3:30 p.m. Break 3:30 - 4:30 p.m. Plenary Session, Lionel Galway Beyond Boredom: The Issue of Data Quality 5:45 p.m. Walk to reception at Santa Fe Museum of Fine Arts Wednesday, June 6, 2007 7:45 - 8:30 a.m. Morning Refreshments 8:30 - 10:00 a.m. Sessions Invited: Design and Analysis of Split-Plots Experiments Chair: Douglas Montgomery, Arizona State University D-optimal Design of Split-split-plot Experiments, Bradley Jones Designing Two-Level Split-Plot Experiments, Murat Kulahci Bayesian Analysis of Split-Plot Experiments with Non-Normal Responses for Evaluating Non-Standard Performance Criteria, Timothy Robinson Invited: Statistical Challenges in Sensor Networks Chair: George Michailidis, University of Michigan Robust Target Detection and Localization in Wireless Sensor Networks, Liza Levina Embedded Networked Sensing, Mark Hansen Sensor Network Deployment Designs, Nicholas Hengartner Contributed: Methods in Statistical Process Monitoring and Control Chair: Willis Jensen, W.L. Gore & Associates The Relationship between the Recurrence Interval and Time-to-Signal Properties of Surveillance Schemes, Shannon Fraker A New Multivariate Extensions of CUSUM Procedure, Hong Li An Assessment of Methods for the Statistical Monitoring of Autocorrelated Data, Victor Morin 10:00 - 10:30 a.m. Break 10:30 - 12:00 noon Sessions Invited: Detection of Aberrations in Public Health Data Organizer: Karen Kafadar, University of Colorado at Denver Chair: Timothy Robinson, University of Wyoming SPC Applications in Biosurveillance: Methods and Issues, Ron Fricker SPC and Disease Surveillance: Detecting Disease Clusters of West Nile Virus in Space and Time, Karen Kafadar The Inspection Paradox: Length-biased Sampling with Variable Test Sensitivity in Industrial Inspection Programs, Sonya Heltshe Contributed: Residuals, Loss Functions, and Control Charts Chair: Mark Bailey, SAS Institute, Inc. Residuals and Their Analyses for Accelerated Life Tests with Step- and Varying-Stress, Wayne Nelson Multivariate Inverted-Normal Loss Functions and Their Applications in Process Targeting, David Drain 12:00 - 1:00 p.m. Lunch for short course attendees 1:00 - 5:00 p.m. Short Course
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