Contributed Program
Tuesday, June 5
Contributed Session 1A
Tuesday, 130pm-3pm
Title: Change-Point Detection
Chair: Daniel R. Jeske, University of California - Riverside
Performance Evaluation Of Certain Procedures For Reacting To A Change In Distribution When The Post-Change Parameter Is Unknown
Sven Knoth, Helmut Schmidt University, Germany
Aleksey S. Polunchenko and Grigory Sokolov, University of Southern CaliforniaUnivariate and Data-Depth Based Multivariate Control Charts Using Trimmed Mean And Winsorized Standard Deviation
Kumaresh Dhara, Kushal Kr. Dey, Bikram Karmakar, Sukalyan Sengupta., Indian Statistical InstituteAn Adaptive Nonparametric Shewhart-Type Linear-Rank Control Chart
Gary R. Mercado and S. Chakraborti, The University of AlabamaPartial Sliced Inverse Regression for Quality-Relevant Multivariate Statistical Process Monitoring
Yue Yu, University of Illinois, Chicago
Zhijie Sun, University of Southern California
Contributed Session 1B
Tuesday, 130pm-3pm
Title: Design of Experiments
Chair: Zhanpan Zhang, GE Global Research
An Application of Fractional Factorial Designs to Study Drug Combinations
Jessica Jaynes, Xianting Ding, Hongquan Xu, Weng Kee Wong, Chih-Ming Ho, UCLAHow to Design Experiments when Categoric Mixture Components Go to Zero
Pat Whitcomb, Stat-Ease, Inc.Reliability Experiments with Random Blocks and Subsampling
Jennifer Kensler, Virginia TechOptimal blocking and semifoldover plans for two-level factorial designs
Po Yang, Depaul University
Contributed Session 1C
Tuesday, 1:30pm-3pm
Title: Control Charts
Chair: Ron Fricker, Naval Postgraduate School
Control Charts for Simultaneous Monitoring of Unknown Means and Variances of Normally Distributed Processes
Amanda Kaye McCracken and Subha Chakraborti, The University of Alabama
Amitava Mukherjee, Aalto Univerity, FinlandProcess Monitoring Strategies for Evaluating Process Performance
Joanne Wendelberger, Brian Weaver, Larry Ticknor, David Collins, Los Alamos National LaboratoryOptimization and Efficiency Analysis of the EWMA Procedure for Detecting Changes in the Exponential Distribution
Aleksey S. Polunchenko, Grigory Sokolov, Alexander G. Tartakovsky, University of Southern CaliforniaInteractive SPC – A Textile Quality Case Study
Scott Wise, SAS Institute
Wednesday, June 6
Natrella Session
Wednesday, 1:30pm-3pm
Session Organizer and Chair: Will Guthrie, NIST
A Review of Process Capability Indices
M. Z. Anis, Indian Statistical InstituteFrom Fault Detection to Diagnosis: An Investigation using Statistical Process Control and Visual Analytics in High-Density Data Environments
Fadel M. Megahed, Virginia Tech
Contributed Session 2A
Wednesday, 1:30pm-3pm
Title: Control Charts
Chair: Tatev Ambartsoumian, University of California - Riverside
Do I Need 5 or 10 Parts to Check if my Measurement Processes are Acceptable?
Victor Aguirre Torres, ITAM
Teresa López Alvarez, KraftCalculating Run Length Quantiles — Go Beyond the Famous and Simple ARL
Sven Knoth, Helmut Schmidt University, GermanyEmpirical Likelihood Confidence Regions for the Evaluation of Continuous-Scale Diagnostic Test in the Presence of Verification Bias
Binhuan Wang, Georgia State UniversityEmpirical likelihood based change point detection method.
Yijie Xue, University of Georgia
Contributed Session 2B
Wednesday, 1:30pm-3pm
Title: Bayesian and Reliability Applications
Chair: J. Marcus Jobe, MIami University (Ohio)
Bayesian Method for Reliability Analysis
Ming Li , GE Global Research Center
William Q. Meeker, Iowa State UniversityEstimation of Curvature: Large Data for Small Problems
James G. Wendelberger, Urban Science Applications, Inc. and The University of New MexicoBayesian Errors-in-Variables Calibration of a Nonlinear Metrology Tool
William Guthrie, National Institute of Standards and TechnologyBayesian Analysis to Determine Predictors' Relative Importance
Xiaoyin Wang, Towson University