Short Course

Our short course on Monday, June 4, 2012, will be "Topics in Statistical Process Control," and will be led by Di Michelson, from SAS Institute.

Di Michelson is a Statistical Training Specialist at SAS, where she develops and teaches courses using JMP® software.  Prior to joining SAS, she spent over 16 years as an industrial statistician in the semiconductor industry, applying statistical methods to all sorts of interesting processes.  During her 11 years at SEMATECH, she developed and updated over twenty ongoing courses and many more short courses.  Her research interests include statistical process control, design of experiments, and statistical modeling, especially when the data contains structure or otherwise fails the usual assumptions.

Di received a Ph.D. from Texas A&M University in 1994.  Her dissertation topic was “Statistical Process Control for Correlated Data.”  In addition, she holds an M.S. in Mathematics, also from Texas A&M University, and a B.S. in Mathematics from Stephen F. Austin State University.  She is a member of the American Statistical Association, actively volunteering in the Austin Chapter and the Quality & Productivity Section.  She is a Senior Member of the American Society for Quality.


  1. Introduction / Review of basic SPC concepts and control charts
  2. Comparison of Control Charts for Independent Data
  3. Discussion of Assumptions
  4. Advanced Topics
    1. multivariate SPC
    2. profile monitoring
    3. Nonparametric or distribution-free methods
    4. Bayesian methods
  5. Monitoring the SPC system with stability indices
    1. number of out-of-control events
    2. appropriateness of limits
    3. appropriateness of centerline
    4. desirability function approach
  6. Process capability
    1. control limits vs specification limits
    2. popular indices, calculation methods
    3. confidence intervals
    4. perils and warnings, appropriate use of indices